The Future of Heterogeneous and Diversified ULSI Nanoelectronics

被引:0
|
作者
Deleonibus, Simon [1 ]
Templier, Francois [1 ]
Andrieu, Francois [1 ]
Batude, Perrine [1 ]
Jehl, Xavier [2 ]
Martin, Francois [1 ]
Milesi, Frederic [1 ]
Morvan, Simeon [1 ]
Nemouchi, Fabrice [1 ]
Sanquer, Marc [2 ]
Vinet, Maud [1 ]
机构
[1] CEA, LETI, MINATEC Campus,17 Rue Martyrs, F-38054 Grenoble, France
[2] CEA, INAC, F-38054 Grenoble, France
关键词
TECHNOLOGY;
D O I
10.1149/05401.0003ecst
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Nanoelectronics will have to face major challenges in the next decades in order to proceed with increasing progress to the sub 10 nm nodes level and face the challenge to approach zero variability. The main requirements will be to reduce leakage currents and reduce access resistances at the same time in order to fully exploit 3D integration at the device, elementary function, chip and system. New progress laws combined to the scaling down of CMOS based technology will emerge to enable new paths to Functional Diversification. New materials and disruptive architectures, mixing logic and memories, Heterogeneous Integration, introducing 3D schemes at the Front End and Back End levels, will come into play to make it possible.
引用
收藏
页码:3 / 14
页数:12
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