Effect of localized magnetic field on the uniform ferromagnetic resonance mode in a thin film

被引：5
|
作者：
Obukhov, Yu. [1 ]
Pelekhov, D. V. [1 ]
Nazaretski, E. [2 ]
Movshovich, R. [2 ]
Hammel, P. C. [1 ]
机构：
[1] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA
[2] Los Alamos Natl Lab, Los Alamos, NM 87545 USA
来源：
APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 17期
关键词：
ferromagnetic resonance; ferromagnetism; magnetic force microscopy; magnetic moments; magnetic thin films; magnetisation; micromagnetics;
D O I：
10.1063/1.3123264
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We theoretically analyze the influence of the micromagnetic probe used in ferromagnetic resonance force microscopy (FMRFM) on the ferromagnetic resonance (FMR) modes in a thin ferromagnetic film. Our analysis of the FMRFM force response reveals three regimes defined by the extent to which the probe perturbs the uniform FMR mode. With closer approach, the FMRFM force grows more slowly because the strengthening probe field suppresses the FMR response. Our analysis agrees well with experimental data and provides theoretical foundations for FMRFM imaging.
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页数：3
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