Surface impedance of thin high temperature superconducting films with a sapphire dielectric resonator

被引：0

作者：

Krupka, J ^{[1
]}

Derzakowski, K ^{[1
]}

Abramowicz, A ^{[1
]}

Baker-Jarvis, J ^{[1
]}

Ono, K ^{[1
]}

Geyer, R ^{[1
]}

机构：

[1] Inst Mikroelektr & Optoelektr PW, PL-00662 Warsaw, Poland

来源：

MIKON-2002: XIV INTERNATIONAL CONFERENCE ON MICROWAVES, RADAR AND WIRELESS COMMUNICATIONS, VOLS 1-3, PROCEEDINGS | 2002年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The dielectric resonator technique is frequently used for surface resistance measurements of superconducting films. Generally, an effective surface resistance has been measured that neglects the finite thickness of superconducting films The dependence of the surface impedance of superconducting films whose thickness is comparable to the London penetration depth is presented.

引用

页码：391 / 393

页数：3

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