Measurement of in-plane strains using electronic speckle and electronic speckle-shearing pattern interferometry

被引：0
|
作者：
Rastogi, PK
机构：
来源：
JOURNAL OF MODERN OPTICS | 1996年 / 43卷 / 08期
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暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This letter reports the application of the electronic speckle and electronic speckle-shearing pattern interferometry for determining the first-order partial derivatives of in-plane displacements. Two possibilities of obtaining the in-plane strain contours are described. Experimental results showing the in-plane strain and the in-plane shearing strain contours on a tensile test specimen are presented.
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页码：1577 / 1581
页数：5
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