High-performance 1.3 μm InAs/GaAs quantum-dot lasers with low threshold current and negative characteristic temperature

被引:8
|
作者
Jin, C. Y. [1 ]
Liu, H. Y.
Badcock, T. J.
Groom, K. M.
Gutierrez, M.
Royce, R.
Hopkinson, M.
Mowbray, D. J.
机构
[1] Univ Sheffield, Dept Elect & Elect Engn, EPSRC Natl Ctr III V Technol, Sheffield S1 3JD, S Yorkshire, England
[2] Univ Sheffield, Dept Phys & Astron, Sheffield S3 7RH, S Yorkshire, England
[3] Fac Ciencias, Dpto Ciencia Mat Ingn Met & Quim Inorgan, Cadiz 11510, Spain
来源
IEE PROCEEDINGS-OPTOELECTRONICS | 2006年 / 153卷 / 06期
关键词
D O I
10.1049/ip-opt:20060048
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A high-growth-temperature GaAs spacer layer (HGTSL) is shown to significantly improve the performance of 1.3 mu m multilayer InAs/GaAs quantum-dot (QD) lasers. The HGTSL inhibits threading dislocation formation, resulting in enhanced electrical and optical characteristics and hence improved performance of QD lasers. To further reduce the threshold current density and improve the room-temperature characteristic temperature (T-o), the high-reflection (HR) coating and p-type modulation doping have been incorporated with the HGTSL technique. A very low continuous-wave 2 room-temperature threshold current of 1.5 mA and a threshold current density of 18.8 A cm(-2) are achieved for a three-layer device with a 1 mm HR/HR cavity, while a very low threshold current density of 48 A cm(-2) and a negative T-o are achieved in the p-doped lasers.
引用
收藏
页码:280 / 283
页数:4
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