IN-SITU DOUBLE CRYSTAL X-RAY TOPOGRAPHIC IMAGING OF AS-GROWING CRYSTAL SURFACES.

被引：0
|
作者：
Vrcelj, R. M. [1 ]
Halfpenny, P. J. [1 ]
Sheen, D. B. [1 ]
Sherwood, J. N. [1 ]
机构：
[1] Univ Strathclyde, Dept Pure & Appl Chem, Glasgow G1 1XL, Lanark, Scotland
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1999年 / 55卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
P05.16.016
引用
收藏
页码：544 / 544
页数：1
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