Emissivity of Electronic Materials, Coatings, and Structures

被引：13

作者：

Muley, Sarang V. ^{[1
]}

Ravindra, Nuggehalli M. ^{[1
]}

机构：

[1] New Jersey Inst Technol, Interdisciplinary Program Mat Sci & Engn, Newark, NJ 07102 USA

来源：

JOM | 2014年 / 66卷 / 04期

关键词：

SILICON-RELATED MATERIALS; TEMPERATURE; GRAPHENE; DIAMOND;

D O I：

10.1007/s11837-014-0940-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This study presents an overview of commonly used electronic materials and nanocoatings, as well as the evolution and significance of emissivity of commonly used electronic materials and nanocoatings. In addition, some key issues are addressed, such as accurate temperature measurements during materials processing and control as well as thermal management in high-power electronic device applications. Case studies of the optical properties of bulk materials, multilayered structures, and electronic devices, mainly bolometers, are discussed and analyzed for optimization.

引用

页码：616 / 636

页数：21

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Nuggehalli M. Ravindra
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