Characterization of electroplated FeSe thin films

Thin films of iron selenide (FeSe) were electrodeposited on tin oxide coated conducting glass Substrates at various bath temperatures, deposition potential and solution pH values. The deposited filius were characterized by X-ray diffraction, energy dispersive X-ray analysis, scanning electron microscopy and optical absorption techniques, respectively. The structure was found to be hexagonal with preferential orientation along {002} plane. X-ray line profile analysis technique by the method of variance has been used to evaluate the microstructural parameters. The variation of microstructural parameters with bath temperature, deposition potential and solution pH values were studied. The observed results are discussed in detail.