Interface Plasmon in Pseudo One-dimensional Si/SiO2 core-shell Nanostructures by Electron Energy Loss Spectroscopy

被引：0
|
作者：
Li, Quan [1 ]
Wang, Juan [1 ]
Chu, Mingwen [2 ]
Malac, Marek [3 ]
机构：
[1] Chinese Univ Hong Kong, Dept Phys, Shatin, Hong Kong, Peoples R China
[2] Natl Taiwan Univ, Ctr Condensed Matter Sci, Taipei, Taiwan
[3] Natl Inst Nanotechnol, Edmonton, AB, Canada
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2011年 / 67卷
基金：
加拿大自然科学与工程研究理事会;
关键词：
EELS; plasmon; silicon;
D O I：
10.1107/S0108767311083905
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS64.P13
引用
收藏
页码：C636 / C636
页数：1
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