Synthesis of highly crystalline black phosphorus thin films on GaN

被引:17
|
作者
Han, Dan [1 ,2 ]
Liu, Qingming [3 ]
Zhang, Qiang [1 ,2 ]
Ji, Jianlong [1 ,2 ]
Sang, Shengbo [1 ,2 ]
Xu, Bingshe [3 ,4 ,5 ]
机构
[1] Taiyuan Univ Technol, Minist Educ, MicroNano Syst Res Ctr, Key Lab Adv Transducers & Intelligent Control Sys, Jinzhong 030600, Peoples R China
[2] Taiyuan Univ Technol, Coll Informat Engn, Jinzhong 030600, Peoples R China
[3] Shaanxi Univ Sci & Technol, Inst Atom & Mol Sci, Xian 710021, Peoples R China
[4] Taiyuan Univ Technol, Minist Educ, Key Lab Interface Sci & Engn Adv Mat, Taiyuan 030024, Peoples R China
[5] Taiyuan Univ Technol, Res Ctr Adv Mat Sci & Technol, Taiyuan 030024, Peoples R China
基金
中国国家自然科学基金;
关键词
LIGHT-EMITTING DIODE; ORIENTATION; PASSIVATION; EFFICIENCY; EMISSION; LAYER;
D O I
10.1039/d0nr06764d
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Black phosphorus (BP) has recently garnered significant attention due to its specific physical properties. At present, high-quality few-layer and thin-film BP is obtained principally by mechanical exfoliation, restricting its device applications in the future. Here, a facile, direct synthesis of highly crystalline thin-film BP on GaN(001) substrates is achieved by conversion of red phosphorus to BP under atmospheric pressure. The synthesized approximate to 100-500 nm thick BP thin films with a length ranging from 4 to 15 mu m can maintain long-term stability with no sign of oxidation after 5 months of exposure to ambient conditions, as indicated by energy dispersive spectroscopy (EDS). Cross-sectional spherical aberration correction transmission electron microscopy (STEM) analysis of the entire thin-film BP sample did not show any aggregation nucleation through the selected sample. The interface of the BP/GaN heterostructure is atomically sharp, which is very critical for high-performance device fabrication using a direct step in the future. And it is worth noting that there are fluctuations of a few atoms on the surface of GaN. Moreover, using first-principles approaches, here we establish a novel kinetic pathway for fabricating thin-film BP via epitaxial growth. The step of fluctuations with a few atoms on the GaN surface are first preferentially covered by P adatoms, then P adatoms cover the remaining part. Once formed, such a structure of thin-film BP is stable, as tested using EDS and STEM. Combining the results of the experiment and simulation, it can be revealed that the P adatom on undulatory GaN is sufficiently mobile and the undulating surface of GaN plays a major role in forming high-quality thin-films of BP. The preferentially covered nearby step growth mechanism discovered here may enable the mass production of high-quality thin-film BP, and could also be instrumental in achieving the epitaxial growth of thin-film BP on GaN and other 2D materials.
引用
收藏
页码:24429 / 24436
页数:8
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