Nanoscale insight into the statics and dynamics of polarization behavior in thin film ferroelectric capacitors

被引：21
|
作者：
Gruverman, A. [1 ]
机构：
[1] Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA
来源：
JOURNAL OF MATERIALS SCIENCE | 2009年 / 44卷 / 19期
基金：
美国国家科学基金会;
关键词：
DOMAIN-WALL; BARIUM-TITANATE; NUCLEATION; MICROSCOPY; GROWTH;
D O I：
10.1007/s10853-009-3623-4
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this study, we review recent advances in PFM studies of micrometer scale ferroelectric capacitors, summarize the experimental PFM-based approach to investigation of fast switching processes, illustrate what information can be obtained from PFM experiments on domains kinetics, and delineate the scaling effect on polarization reversal mechanism. Particular attention is given to PFM studies of mechanical stress effect on polarization stability.
引用
收藏
页码：5182 / 5188
页数：7
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