X-ray-induced fluorescence spectroscopy with highly charged ion beam produced by a laser ion source

被引：1
|
作者：
Ozawa, S
Wakasugi, M
Okamura, M
Katayama, T
Koizumi, T
Serata, M
机构：
[1] RIKEN, Wako, Saitama 3510198, Japan
[2] Rikkyo Univ, Toshima Ku, Tokyo 171, Japan
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2004年 / 75卷 / 05期
关键词：
D O I：
10.1063/1.1691522
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We designed and tested a beam line for transport of highly charged ions produced by a laser ion source. The ion beam is prepared for an x-ray spectroscopy experiment based on a laser-induced fluorescence spectroscopy. A C4+ beam which has a peak current of 160 muA and bunch width of 500 ns was obtained. It corresponds to 1.3 x 10(8) ions/pulse, and the quantity enables the x-ray spectroscopy experiment. (C) 2004 American Institute of Physics.
引用
收藏
页码：1579 / 1581
页数：3
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