A NO-REFERENCE DEEP LEARNING QUALITY ASSESSMENT METHOD FOR SUPER-RESOLUTION IMAGES BASED ON FREQUENCY MAPS

被引:7
|
作者
Zhang, Zicheng [1 ]
Sun, Wei [1 ]
Min, Xiongkuo [1 ]
Zhu, Wenhan [1 ]
Wang, Tao [1 ]
Lu, Wei [1 ]
Zhai, Guangtao [1 ]
机构
[1] Shanghai Jiao Tong Univ, Inst Image Commun & Network Engn, Shanghai, Peoples R China
关键词
super-resolution; no-reference image quality assessment; frequency maps; deep learning;
D O I
10.1109/ISCAS48785.2022.9937738
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To support the application scenarios where high-resolution (HR) images are urgently needed, various single image superresolution (SISR) algorithms are developed. However, SISR is an ill-posed inverse problem, which may bring artifacts like texture shift, blur, etc. to the reconstructed images, thus it is necessary to evaluate the quality of super-resolution images (SRIs). Note that most existing image quality assessment (IQA) methods were developed for synthetically distorted images, which may not work for SRIs since their distortions are more diverse and complicated. Therefore, in this paper, we propose a no-reference deep-learning image quality assessment method based on frequency maps because the artifacts caused by SISR algorithms are quite sensitive to frequency information. Specifically, we first obtain the highfrequency map (HM) and low-frequency map (LM) of SRI by using Sobel operator and piecewise smooth image approximation. Then, a two-stream network is employed to extract the quality-aware features of both frequency maps. Finally, the features are regressed into a single quality value using fully connected layers. The experimental results show that our method outperforms all compared IQA models on the selected three super-resolution quality assessment (SRQA) databases.
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页码:3170 / 3174
页数:5
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