A double-slits interference method for phase modulation measurement in holographic display

被引：0
|
作者：
Yang, Lei [1 ]
Xia, Jun [1 ]
Zhang, Xiaobing [1 ]
Lei, Wei [1 ]
Wang, Baoping [1 ]
机构：
[1] Southeast Univ, Sch Elect Sci & Engn, Nanjing 210096, Jiangsu, Peoples R China
来源：
PROCEEDINGS OF CHINA DISPLAY/ASIA DISPLAY 2011 | 2011年
关键词：
double slits interference; phase-only modulation; holographic display; SPATIAL LIGHT-MODULATOR;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In order to precisely measure the phase shifting for holographic display, a new spatial light modulator (SLM) characterization procedure is presented, based on the analysis of the interference fringes of double-slits interference. We identify the linear range of phase shift of the modulator by measuring both phase and intensity. Experimental results show that the 30-180 grey scales linear ranges of the phase shift which proves that it is a simple and reliable method to measure the characteristics of phase modulation.
引用
收藏
页码：612 / 614
页数：3
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