Temperature Compensation of Cone Penetration Probe Sensors

被引：0

作者：

Cepulis, V. ^{[1
]}

Markevicius, V. ^{[1
]}

Navikas, D. ^{[1
]}

机构：

[1] Kaunas Univ Technol, Dept Elect Engn, LT-51368 Kaunas, Lithuania

来源：

2009 SECOND INTERNATIONAL CONFERENCE ON ADVANCES IN CIRCUITS, ELECTRONICS AND MICRO-ELECTRONICS | 2009年

关键词：

CPT probe; sensor; strain gauge; measure calibration; compensation;

D O I：

10.1109/CENICS.2009.15

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Here is presented a temperature compensation technique of cone penetration probe sensors (CPT). Probe internal temperature influence to accuracy of ADC and sensors bridge output voltage was investigated. There are presented theoretical results of bridge calibration and strain measure errors.

引用

页码：52 / 55

页数：4

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