General theory of amplitude-modulation atomic force microscopy

被引：122
|
作者：
Lee, Manhee [1 ]
Jhe, Wonho [1 ]
机构：
[1] Seoul Natl Univ, Sch Phys & Astron, Seoul 151747, South Korea
来源：
PHYSICAL REVIEW LETTERS | 2006年 / 97卷 / 03期
关键词：
D O I：
10.1103/PhysRevLett.97.036104
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We present a general analytical theory that enables one to determine accurately the unknown tip-sample interactions from the experimental measurement of the amplitude and phase of the oscillating tip in amplitude-modulation atomic force microscopy (AM-AFM). We apply the method to the known Lennard-Jones-type forces and find excellent agreement with the reconstructed results. AM-AFM, widely used in air and liquid, is now not only an imaging tool but also a quantitative force measurement tool.
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页数：4
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