Auxiliary interferometer in an optoelectronic swept-frequency laser and its application to the measurement of the group refractive index

被引：2

作者：

Zhao, Enming ^{[1
]}

Shen, Heliang ^{[2
]}

Liu, Shuangqiang ^{[3
]}

Liu, Guangyu ^{[1
]}

Zhou, Bao ^{[1
]}

Wang, Chen ^{[1
]}

Xing, Chuanxi ^{[4
]}

Miao, Peixian ^{[5
]}

Shi, Yanchao ^{[5
]}

机构：

[1] Dali Univ, Sch Engn, Dali, Peoples R China

[2] Zhejiang Univ, Coll Opt Sci & Engn, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Zhejiang, Peoples R China

[3] Sun Yat Sen Univ, Sch Phys & Astron, Zhuhai, Guangdong, Peoples R China

[4] Yunnan Minzu Univ, Sch Elect & Informat Engn, Kunming, Yunnan, Peoples R China

[5] Natl Key Lab Sci & Technol Vacuum Technol & Phys, Lanzhou, Peoples R China

来源：

APPLIED OPTICS | 2020年 / 59卷 / 33期

基金：

中国国家自然科学基金;

关键词：

Refractive index;

D O I：

10.1364/AO.402420

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An optoelectronic swept-frequency laser (SFL) is an optoelectronic feedback system that includes an auxiliary interferometer that can exert precise control over the optical frequency sweep. The arm-length difference (ALD) of the auxiliary interferometer directly affects the performance of the whole system. We established a theoretical model to choose the optimal ALD of an auxiliary interferometer in an optoelectronic SFL system using a frequency-modulated continuous-wave reflectometry experimental setup. The experimental results indicated that, based on our system, the optimal ALD was 7 m, which agreed with the theoretical analysis. As an example application, we implemented the proposed system for measurement of the group refractive index of a glass sample. A minimum measurement error of 0.12% was obtained with the ALD of7 m. (C) 2020 Optical Society of America

引用

页码：10294 / 10303

页数：10

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