Measurement of the birefringence of UV-written channel silica waveguides by magnetooptic polarization-mode coupling

被引：15
|
作者：
Johlen, D [1 ]
Stolze, G [1 ]
Renner, H [1 ]
Brinkmeyer, E [1 ]
机构：
[1] Tech Univ Hamburg, D-21073 Hamburg, Germany
来源：
JOURNAL OF LIGHTWAVE TECHNOLOGY | 2000年 / 18卷 / 02期
关键词：
Bragg gratings; channel waveguides; form birefringence; silica-on-silicon; ultraviolet (UV)-written waveguides; waveguide birefringence;
D O I：
10.1109/50.822791
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report the measurement of the birefringence in integrated-optical waveguides using magnetooptical coupling between the two principal polarizations of the fundamental mode. We demonstrate this measurement technique for directly ultrviolet (UV)-written channel waveguides in silica-on-silicon and silica-on-silica, The dependence of the waveguide birefringence on the UV-writing power and UV polarization is investigated. The results are compared with the birefringence of etched waveguides in comparable material systems, An analytical formula for the form birefringence in buried channel waveguides is developed, and measured data are compared with theoretical results.
引用
收藏
页码：185 / 192
页数：8
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