Carrier noise reduction in speckle correlation interferometry by an unique averaging technique

被引:0
|
作者
Vikram, CS [1 ]
Pechersky, MJ
机构
[1] Univ Alabama, Ctr Appl Opt, Huntsville, AL 35899 USA
[2] Westinghouse Savannah River Co, Savannah River Technol Ctr, Aiken, SC 29802 USA
来源
OPTIK | 2000年 / 111卷 / 03期
关键词
electronic speckle pattern interferometry; speckle noise averaging;
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present experimental result of carrier speckle noise averaging by a novel approach to generate numerous identical correlation fringes with randomly different speckles. The surface under study is sprayed with a new dry paint or a layer each time for the repetitive experiments to generate randomly different surfaces or the carrier speckle patterns.
引用
收藏
页码:124 / 126
页数:3
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