A wavelet-based approach for the extraction of event related potentials from EEG

被引:0
|
作者
Fatourechi, M [1 ]
Mason, SG [1 ]
Birch, GE [1 ]
Ward, RK [1 ]
机构
[1] Univ British Columbia, Dept Elect & Comp Engn, Vancouver, BC V5Z 1M9, Canada
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Event Related Potentials (ERPs) are of interest to many researchers seeking knowledge about the functions of the brain. ERPs are low-frequency events that are usually obscured in single trial analysis. To visualize these signals; most of the reliable solutions at the present time use the ensemble averages of many single trials. In this paper, a wavelet-based method called Statistical Coefficient Selection (SCS) is used for the extraction of ERPs from EEG signals. Unlike other wavelet-based denoising methods, the current method does not focus on the wavelet coefficients of the signal itself. Instead, it selects the coefficients based on the statistical study of trials from training data set. Simulation results show the superiority of the proposed SCS method in extracting ERPs in comparison with other filtering approaches.
引用
收藏
页码:737 / 740
页数:4
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