High-performance engineered gate transistor-based compact digital circuits

被引:0
|
作者
Kumar, S. [1 ]
Loan, S. A. [1 ]
Alamoud, A. M. [2 ]
机构
[1] Cent Univ New Delhi, Dept Elect & Commun Engn, JMI, New Delhi, India
[2] King Saud Univ, Dept Elect Engn, Riyadh, Saudi Arabia
关键词
MOSFET; electrodes; CMOS logic circuits; logic gates; NOR circuits; NAND circuits; integrated circuit design; engineered gate transistor-based compact digital circuit; engineering MOSFET gate electrode; gate engineered single device; pull-up path; PU path; pulldown path; PD path; static CMOS gate circuit; NAND gate; NOR gate; exclusive-OR gate; XOR gate; engineered gate n-type MOS; engineered gate p-type MOS; mixed mode simulation; combinational circuit; sequential circuit; XOR;
D O I
10.1049/el.2016.3899
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel method for designing and realising compact digital circuits by engineering MOSFET gate electrode is proposed. The novelty is the use of gate engineered single devices in the pull-up (PU) and pull-down (PD) paths of a static CMOS gate instead of multiple transistors as used in conventional CMOS implementations of circuits. Herein, two input NAND, NOR, and exclusive-OR (XOR) gates employing the proposed gate engineering concept are designed and simulated. Engineered gate N-type MOS and P-type MOS are used for PD and pull-up circuits, respectively. Since only two devices are used for a complete circuit: one in PU network and other in PD network; therefore, area and power of the proposed circuits get reduced significantly in comparison with the conventional static CMOS circuits. Mixed mode simulations have shown that the proposed technique realises NAND, NOR and XOR operations perfectly and it can be extended to realise other combinational and sequential circuits easily.
引用
收藏
页码:138 / 140
页数:2
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