Time-of-flight atom-probe field ion microscope studies of surface-related phenomena

被引:2
|
作者
Tsong, TT [1 ]
机构
[1] Acad Sinica, Inst Phys, Taipei 11529, Taiwan
关键词
alloy segregations; cluster ions; field dissociation; binding energy of surface atoms;
D O I
10.1002/sia.1692
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The time-of-flight atom-probe field ion microscope is both a single-atom detection sensitivity mass-to-charge ratio analyser and an ion energy analyser, provided that the instrument resolution is good enough. Its major applications are in material analysis. However, it has been used also for studying surface-related phenomena such as surface segregation of alloys, mechanisms of ion formation in field desorption, novel ion and cluster ion formation in laser-stimulated field ion emission, field dissociation of compound ions and its novel isotope effects and analysis of the site-specific binding energy of surface atoms, etc. Some of these studies are briefly reviewed here. Copyright (C) 2004 John Wiley Sons, Ltd.
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页码:365 / 371
页数:7
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