CCD DETECTOR SYSTEMS FOR SINGLE-CRYSTAL STUDIES: BENEFITS OF SCANNING FOUR AXES CONCURRENTLY.

被引：0
|
作者：
Straver, Leo H. [1 ]
Coetzee, Anita [1 ]
Hooft, Rob W. W. [1 ]
van Meurs, Frank [1 ]
机构：
[1] Nonius BV Applicat Lab, NL-2600 AV Delft, Netherlands
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1999年 / 55卷
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
P13.01.008
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页码：238 / 238
页数：1
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