New position error signal generation method for SPM based data storage system

被引：3
|
作者：
Lee, Choong Woo [2 ]
Kang, Hyun Jae [1 ]
Chung, Chung Choo [1 ]
Kim, Young-Sik [3 ]
机构：
[1] Hanyang Univ, Dept Elect Engn, Seoul 133791, South Korea
[2] Hanyang Univ, Div Elect & Comp Engn, Seoul 133791, South Korea
[3] LG Elect Inst Technol, Devices & Mat Lab, Seoul 137724, South Korea
来源：
MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 2009年 / 15卷 / 10-11期
关键词：
PROBE STORAGE; MILLIPEDE; ALGORITHM;
D O I：
10.1007/s00542-009-0868-4
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new position error signal (PES) generation method for scanning probe microscope (SPM) based Data Storage (SDS) system is proposed. In this paper, instead of pits used by the conventional methods, two stripe patterns (sync and PES patterns) are used. The two patterns can be either etched or nano imprinted for mass production. In the proposed method analog-to-digital converters are no longer needed. Instead, a simple digital counter and phase locked loop logic along with analog comparators are used. We present how to construct PES, and investigate its quality degradation due to manufacturing uncertainties such as misalignment during assembly process and scanning speed jitters. Simulation and experimental results with PES quality analysis were presented to confirm the validity of the proposed patterns.
引用
收藏
页码：1663 / 1674
页数：12
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