A Total Variation regulator for the extraction of step function depth profiles from ARXPS data

被引：2

作者：

Paynter, R. W. ^{[1
]}

机构：

[1] INRS Energie Mat Telecommun, Varennes, PQ J3X 1S2, Canada

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2015年 / 205卷

关键词：

Tikhonov regularization; Angle-resolved photoelectron spectroscopy; Interfacial resolution; XPS; REGULARIZATION; AES;

D O I：

10.1016/j.elspec.2015.10.005

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Simulations were conducted to generate and invert noisy ARXPS data, starting from known pseudo-step-function depth profiles. In the recovery of the depth profiles, a lst-orderTikhonov regulator was compared with a Total Variation regulator. It was found that the profiles extracted using the Total Variation regulator tended to better resemble the true profile in the case of a single step function. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：122 / 129

页数：8

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