Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides

被引：2

作者：

Iwai, K ^{[1
]}

Abe, Y ^{[1
]}

Matsuura, Y ^{[1
]}

Miyagi, M ^{[1
]}

机构：

[1] Tohoku Univ, Fac Engn, Dept Elect Commun, Aoba Ku, Sendai, Miyagi 9808579, Japan

来源：

OPTICAL ENGINEERING | 2002年 / 41卷 / 07期

关键词：

waveguides; refractive index; optical design; infrared lasers; fiber optics;

D O I：

10.1117/1.1485090

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An idea of an equivalent refractive index for the ray tracing calculation of hollow core waveguides is proposed. A virtual, complex refractive index is uniquely found by minimizing the difference between reflectivity of a virtual monolayer material and a metal substrate coated with a dielectric film. By using this technique, transmission losses of a delivery system consisting of a hollow fiber and a tapered hollow waveguide are calculated. (C) 2002 Society of Photo-Optical Instrumentation Engineers.

引用

页码：1471 / 1472

页数：2

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