Dependence of wavelength control on dielectric structure for vertical-cavity surface-emitting lasers

被引：3
|
作者：
Huffaker, DL
机构：
[1] Microelectronics Research Center, Dept. of Elec. and Comp. Engineering, University of Texas at Austin, Austin
来源：
JOURNAL OF APPLIED PHYSICS | 1997年 / 81卷 / 03期
关键词：
D O I：
10.1063/1.363893
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Calculated data are presented that compare the control of the lasing wavelength for different dielectric vertical-cavity surface-emitting lasers that use a GaAs tuning layer of variable thickness to control the longitudinal cavity resonance. The advantages of high-contrast Bragg reflectors and a half-wave cavity spacer thickness become obvious in achieving both a wide tuning range and minimizing reflectivity changes. (C) 1997 American Institute of Physics.
引用
收藏
页码：1598 / 1600
页数：3
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