Transactional Test Environment For Faster And Early Verification Of Digital Designs

被引:0
|
作者
Kakani, Rama Krishna [1 ]
Darji, A. D. [1 ]
机构
[1] SV Natl Inst Technol, Elect & Commun Dept, Surat, India
关键词
Transactions; verification; agents; TLM; simulation dump; Test environment (TE);
D O I
10.1109/ICCED.2018.00037
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
while verifying any digital design, it is very important to think about a feature or an issue in that design at the appropriate level of abstraction for getting better verification productivity. This is done by creating the environment to be capable enough to verify the design at all these abstraction levels. Although the interfaces of Design under Test (DUT) ultimately are represented by pin level activity, it is important and useful to maintain most of the verification tasks, like the stimuli generation and data collection, at the transaction level. This work concentrates on creation of a transaction level verification environment similar to the Universal Verification Methodology (UVM), which provides a set of communication channels to connect the components at transaction level using Transaction level Modelling (TLM) interfaces. The methodology described in this work provides a novel way for partitioning the environment and reducing the maintenance of low-level code through auto generation of synthesiz able collectors and drivers as well as the first level code for the Bus Functional Models (BFM) and monitors in the test environment. These low-level components are developed to he robust enough to accept the stimuli from a variety of sources to the same agents and keeping the environment mostly independent of the mode of use. The simulation dump for transactions is stored and used as a stimuli to the same agents used during the simulation in the absence of DUT, this replay mode reduces the turnaround time for building the verification collaterals significantly. A case study on verifying a processor sleep handling logic like the sleep walking logics for Memory controller units being implemented these days, is done in this described environment to observe significant improvement in simulation time and verification collateral development.
引用
收藏
页码:148 / 152
页数:5
相关论文
共 50 条
  • [1] Test examinations - faster verification of results
    不详
    [J]. E-MENTOR, 2005, (01): : 27 - 27
  • [2] THE FUTURE OF DIGITAL ENGINEERING DESIGN: DISCOVERING OPTIMUM DESIGNS FASTER
    Os-Miani, Camilla
    [J]. Advanced Materials and Processes, 2022, 180 (07): : 21 - 23
  • [3] THE FUTURE OF DIGITAL ENGINEERING DESIGN: DISCOVERING OPTIMUM DESIGNS FASTER
    Osmiani, Camilla
    [J]. ADVANCED MATERIALS & PROCESSES, 2022, 180 (07): : 21 - 23
  • [4] Formal Property Verification for Early Discovery of Functional Flaws in Digital Designs: A Designer's Guide
    Kissich, Meinhard
    Baunach, Marcel
    [J]. 2023 26TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN, DSD 2023, 2023, : 734 - 741
  • [5] Test and Verification Environment and Methodology for Vernier Time-to-Digital Converter Pixel Array
    Kadluhowski, Lukasz A.
    Kmon, Piotr
    [J]. 2021 24TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS), 2021, : 137 - 140
  • [6] VARED: Verification and Analysis of Requirements and Early Designs
    Badger, Julia
    Throop, David
    Claunch, Charles
    [J]. 2014 IEEE 22ND INTERNATIONAL REQUIREMENTS ENGINEERING CONFERENCE (RE), 2014, : 325 - 326
  • [7] A DISTRIBUTED MODELING APPROACH FOR SIMULATION AND VERIFICATION OF DIGITAL DESIGNS
    GHOSH, S
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1987, 34 (10): : 1171 - 1181
  • [8] Timing verification and delay test generation for hierarchical designs
    Krishnamachary, A
    Abraham, JA
    Tupuri, RS
    [J]. VLSI DESIGN 2001: FOURTEENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, 2001, : 157 - 162
  • [9] A Reusable Pseudo-Random Verification Environment for Complex Digital Designs: the Space Wire Interface Case Study
    Saponara, Sergio
    Vitullo, Francesco
    Petri, Esa
    Fanucci, Luca
    [J]. 2009 IEEE INTERNATIONAL WORKSHOP ON INTELLIGENT DATA ACQUISITION AND ADVANCED COMPUTING SYSTEMS: TECHNOLOGY AND APPLICATIONS, 2009, : 102 - 106
  • [10] Scopes test mixed analog and digital designs
    Keller, D
    [J]. MICROWAVES & RF, 2000, 39 (05) : 218 - 218