Comparison of optical elements for x-ray powder diffraction analysis in para-focusing and parallel beam geometries

被引：0
|
作者：
Reiss, C. A. [1 ]
机构：
[1] Philips Analyt, NL-7602 EA Almelo, Netherlands
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2000年 / 56卷
关键词：
X-ray powder diffraction; Bragg Brentano geometry; parallel beam geometry;
D O I：
10.1107/S0108767300024855
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
s7.m0.p10
引用
收藏
页码：S222 / S222
页数：1
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