Design and test of component circuits of an integrated quantum voltage Cross Mark noise source for Johnson noise thermometry

被引:11
|
作者
Yamada, Takahiro [1 ]
Maezawa, Masaaki [1 ]
Urano, Chiharu [2 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Nanoelect Res Inst, Tsukuba, Ibaraki 308568, Japan
[2] Natl Inst Adv Ind Sci & Technol, Natl Metrol Inst Japan, Tsukuba, Ibaraki 308568, Japan
关键词
Johnson noise thermometry; Quantum voltage noise source; Josephson junction; Rapid single flux quantum; Pseudo-random number generator; Variable pulse number multiplier; OPERATION; STANDARD;
D O I
10.1016/j.physc.2015.02.046
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present design and testing of a pseudo-random number generator (PRNG) and a variable pulse number multiplier (VPNM) which are digital circuit subsystems in an integrated quantum voltage noise source for jonson noise thermometry. Well-defined, calculable pseudo-random patterns of single flux quantum pulses are synthesized with the PRNG and multiplied digitally with the VPNM. The circuit implementation on rapid single flux quantum technology required practical circuit scales and bias currents, 279 junctions and 33 mA for the PRNG, and 1677 junctions and 218 mA for the VPNM. We confirmed the circuit operation with sufficiently wide margins, 80-120%, with respect to the designed bias currents. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:85 / 88
页数:4
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