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- [3] Simultaneously determining Young's modulus, coefficient of thermal expansion, Poisson ratio and thickness of thin films on silicon wafer 54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2004, : 901 - 905
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- [8] Examination of bulge test for determining residual stress, Young's modulus, and Poisson's ratio of 3C-SiC thin films Mehregany, M. (mxm31@cwru.edu), 1600, American Society of Civil Engineers (16):