Microfabricated wire scanner for photon beam characterization

被引：1
|
作者：
Greco, S. [1 ,2 ]
Giglia, A. [1 ]
Malvezzi, M. [1 ]
Nannarone, S. [1 ]
DalZilio, S. [1 ]
Lazzarino, M. [1 ]
机构：
[1] CNR IOM, TASC Lab, AREA Sci Pk, I-34143 Trieste, Italy
[2] Univ Trieste, Grad Sch Nanotechnol, Ple Europa 1, I-34143 Trieste, Italy
来源：
JOURNAL OF INSTRUMENTATION | 2018年 / 13卷
关键词：
Beam-line instrumentation (beam position and profile monitors; beam-intensity monitors; bunch length monitors); Detector design and construction technologies and materials; PROFILE;
D O I：
10.1088/1748-0221/13/03/C03037
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A sensitive, accurate, and real-time measurement of the photon beam profile is a crucial issue in synchrotron radiation experiments. Most common solutions include the use of insulated wires and phosphorescent materials with remote (in atmosphere) TV cameras. To face this request we designed and realized a micro-fabricated wire scanner fully UHV compatible, based on electrons photoemission under UV-X irradiation, suitable for in situ/on line beam characterization. The device provides micrometer accuracy, is compatible with most end-station sample holders, is easy to operate providing the requested information in a matter of minutes.
引用
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页数：11
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