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Synergetic effect of H2O2 and glycine on cobalt CMP in weakly alkaline slurry
被引:83
|作者:
Jiang, Liang
[1
,2
]
He, Yongyong
[1
]
Li, Yan
[2
]
Li, Yuzhuo
[2
]
Luo, Jianbin
[1
]
机构:
[1] Tsinghua Univ, State Key Lab Tribol, Beijing 100084, Peoples R China
[2] Clarkson Univ, Ctr Adv Mat Proc, Potsdam, NY 13699 USA
关键词:
Cobalt chemical mechanical polishing;
Hydrogen peroxide;
Glycine;
Synergetic effect;
CHEMICAL-MECHANICAL PLANARIZATION;
ELECTROCHEMICAL-BEHAVIOR;
HYDROGEN-PEROXIDE;
ACID SLURRY;
RU CMP;
COPPER;
CORROSION;
PERIODATE;
ADHESION;
LAYER;
D O I:
10.1016/j.mee.2014.02.002
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Cobalt has been selected as one of the most promising candidates of barrier metals for the next-generation ultra-large scale integrated circuits. This paper investigated the synergetic effect of oxidizer like H2O2 and complexing agent like glycine on the cobalt polishing performance. It is revealed that the cobalt static etching rate (SER) and removal rate (RR) are gradually suppressed with increasing pH due to the formation of compact and passive cobalt oxides on the cobalt surface, and the addition of high concentration of H2O2 can further reduce the cobalt RR. However, by the synergetic effect of H2O2 and glycine at pH 8.00, the cobalt SER and RR can be enhanced due to the formation of soluble Co(III)-glycine complex. (C) 2014 Elsevier B.V. All rights reserved.
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页码:82 / 86
页数:5
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