Spatial carrier-fringe pattern analysis by means of wavelet transform: wavelet transform profilometry

被引：173
|
作者：
Zhong, JG [1 ]
Weng, JW [1 ]
机构：
[1] Jinan Univ, Dept Phys, Guangzhou 510632, Peoples R China
来源：
APPLIED OPTICS | 2004年 / 43卷 / 26期
关键词：
D O I：
10.1364/AO.43.004993
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present an analysis of a spatial carrier-fringe pattern in three-dimensional (3-D) shape measurement by using the wavelet transform, a tool excelling for its multiresolution in the time- and space-frequency domains. To overcome the limitation of the Fourier transform, we introduce the Gabor wavelet to analyze the phase distributions of the spatial carrier-fringe pattern. The theory of wavelet transform profilometry, an accuracy check by means of a simulation, and an example of 3-D shape measurement are shown. (C) 2004 Optical Society of America.
引用
收藏
页码：4993 / 4998
页数：6
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