Redistribution of a Material at Femtosecond Laser Ablation of a Thin Silver Film

被引:9
|
作者
Danilov, P. A. [1 ]
Zayarny, D. A. [1 ]
Ionin, A. A. [1 ]
Kudryashov, S. I. [1 ,2 ,3 ]
Rudenko, A. A. [1 ]
Kuchmizhak, A. A. [3 ,4 ]
Vitrik, O. B. [3 ,4 ]
Kulchin, Yu. N. [3 ]
Zhakhovsky, V. V. [5 ,6 ]
Inogamov, N. A. [5 ,6 ]
机构
[1] Russian Acad Sci, Lebedev Phys Inst, Moscow 119991, Russia
[2] Natl Res Nucl Univ MEPhI, Moscow Engn Phys Inst, Moscow 115409, Russia
[3] Russian Acad Sci, Far Eastern Branch, Inst Automat & Control Proc, Vladivostok 690041, Russia
[4] Far Eastern Fed Univ, Vladivostok 690041, Russia
[5] Dukhov Res Inst Automat, Moscow 127055, Russia
[6] Russian Acad Sci, Landau Inst Theoret Phys, Chernogolovka 142432, Moscow Region, Russia
基金
俄罗斯科学基金会;
关键词
PULSES; NANOSTRUCTURES; NANODROPLETS; FABRICATION; NANOJETS;
D O I
10.1134/S0021364016230077
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Energy-dispersive X-ray microspectroscopy is used for the first time to quantitatively study the spatial displacement of the material of a 100-nm silver film irradiated by a single femtosecond laser pulse focused on a small spot in the diffraction limit. The silver mass distribution over radial cross sections is determined and matter balance is analyzed for the resulting radially symmetric submicron structures of a microcone with a nanospike with various heights and a through hole. Hydrodynamic processes and phase transitions inducing the melting of the film, motion of the melt, and its recrystallization within a focal spot are studied.
引用
收藏
页码:759 / 765
页数:7
相关论文
共 50 条
  • [1] Redistribution of a material at femtosecond laser ablation of a thin silver film
    P. A. Danilov
    D. A. Zayarny
    A. A. Ionin
    S. I. Kudryashov
    A. A. Rudenko
    A. A. Kuchmizhak
    O. B. Vitrik
    Yu. N. Kulchin
    V. V. Zhakhovsky
    N. A. Inogamov
    [J]. JETP Letters, 2016, 104 : 759 - 765
  • [2] Femtosecond laser ablation of a thin silver film in air and water
    N. A. Smirnov
    S. I. Kudryashov
    P. A. Danilov
    A. A. Nastulyavichus
    A. A. Rudenko
    A. A. Ionin
    A. A. Kuchmizhak
    O. B. Vitrik
    [J]. Optical and Quantum Electronics, 2020, 52
  • [3] Femtosecond laser ablation of a thin silver film in air and water
    Smirnov, N. A.
    Kudryashov, S. I.
    Danilov, P. A.
    Nastulyavichus, A. A.
    Rudenko, A. A.
    Ionin, A. A.
    Kuchmizhak, A. A.
    Vitrik, O. B.
    [J]. OPTICAL AND QUANTUM ELECTRONICS, 2020, 52 (02)
  • [4] Femtosecond pulsed laser ablation of thin gold film
    Venkatakrishnan, K
    Tan, B
    Ngoi, BKA
    [J]. OPTICS AND LASER TECHNOLOGY, 2002, 34 (03): : 199 - 202
  • [5] Metal thin film ablation with femtosecond pulsed laser
    Kim, Jaegu
    Na, Suckjoo
    [J]. OPTICS AND LASER TECHNOLOGY, 2007, 39 (07): : 1443 - 1448
  • [6] Micromachining of a thin film by laser ablation using femtosecond laser with masks
    Nakata, Y
    Okada, T
    Maeda, M
    [J]. OPTICS AND LASERS IN ENGINEERING, 2004, 42 (04) : 389 - 393
  • [7] Single-shot front-side nanoscale femtosecond laser ablation of a thin silver film
    Danilov, P. A.
    Drozdova, E. A.
    Ionin, A. A.
    Kudryashov, S. I.
    Odinokov, S. B.
    Rudenko, A. A.
    Yurovskikh, V. I.
    Zayarny, D. A.
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2014, 117 (03): : 981 - 985
  • [8] Single-shot front-side nanoscale femtosecond laser ablation of a thin silver film
    P. A. Danilov
    E. A. Drozdova
    A. A. Ionin
    S. I. Kudryashov
    S. B. Odinokov
    A. A. Rudenko
    V. I. Yurovskikh
    D. A. Zayarny
    [J]. Applied Physics A, 2014, 117 : 981 - 985
  • [9] Burst-Mode Femtosecond Pulsed Laser Deposition for Control of Thin Film Morphology and Material Ablation
    Murakami, Makoto
    Liu, Bing
    Hu, Zhendong
    Liu, Zhenlin
    Uehara, Yuzuru
    Che, Yong
    [J]. APPLIED PHYSICS EXPRESS, 2009, 2 (04) : 0425011 - 0425013
  • [10] Nanostructure formation processes in femtosecond laser ablation of thin film surfaces
    Miyaji, Godai
    Miyazaki, Kenzo
    [J]. LASER APPLICATIONS IN MICROELECTRONIC AND OPTOELECTRONIC MANUFACTURING VII, 2009, 7201