A new method for measuring cut-off wavelengths of waveguides with arbitrary cross sections

被引：0
|
作者：
Zhou, H
Lin, W
Ding, W
Zhou, C
机构：
[1] Inst Appl Phys & Computat Math, Lab Computat Phys, Beijing 100088, Peoples R China
[2] Univ Elect Sci & Technol China, Chengdu 610054, Peoples R China
[3] China Acad Engn Phys, Chengdu 610003, Peoples R China
来源：
JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS | 1999年 / 13卷 / 10期
关键词：
D O I：
10.1163/156939399X00763
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new method for measuring the cut-off wavelengths of waveguides with arbitrary cross sections is proposed in this paper. Based on the theory of waveguide resonant cavity, the measurements of the waveguides are transformed into those of resonant cavities. Consequently, not only the difficulties of matching are excluded, but also high accuracy is achieved. This measurement method is regarded as more convenient in microwave engineering design.
引用
收藏
页码：1431 / 1438
页数：8
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