Structure determination by neutron and synchrotron X-ray scattering

被引:0
|
作者
Fuess, H [1 ]
机构
[1] Darmstadt Univ Technol, Dept Mat Sci, D-64287 Darmstadt, Germany
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中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
The basis for modelling crystals is the enormous wealth of crystal structures determined by diffraction methods. Neutron diffraction has added complementary precision to structural data and inelastic neutron scattering gives valuable information on interatomic and intermolecular forces. The tunability and high brilliance of third generation synchrotron sources opens new fields in structure determination of large molecules by using the anomalous dispersion of Xrays near to the absorption edge. Tremendous progress in computer facilities, monochromators and detection devices allow experiments at extreme conditions (temperature, pressure) and at very short measuring times. The precision of deformation density distribution is considerably enhanced by the use of short wavelengths with synchrotron radiation.
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页码:55 / 78
页数:24
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