Reliability characterization of mixed-signal chips

被引：0
|
作者：
Abel, C
Michael, C
Ismail, M
Teng, CS
Lahri, R
机构：
[1] NATL SEMICOND CORP,SANTA CLARA,CA
[2] OHIO STATE UNIV,DEPT ELECT ENGN,COLUMBUS,OH 43210
来源：
IEEE CIRCUITS & DEVICES | 1997年 / 13卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：8 / 10
页数：3
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