Production of highly charged ion beams with the Grenoble test electron cyclotron resonance ion source (plenary)

被引:46
|
作者
Hitz, D
Girard, A
Serebrennikov, K
Melin, G
Cormier, D
Mathonnet, JM
Chartier, J
Sun, L
Briand, JP
Benhachoum, M
机构
[1] CEA, DRFM, SBT, F-38054 Grenoble 9, France
[2] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
[3] Univ Paris 06, ERIS, Paris, France
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2004年 / 75卷 / 05期
关键词
D O I
10.1063/1.1675930
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Grenoble Test Source (GTS) is a room temperature electron cyclotron resonance ion source whose purpose is to deepen the knowledge of this type of device. GTS was designed according to magnetic scaling laws determined with the SERSE source [Hitz et al., Rev. Sci. Instrum. 73, 509 (2002); Gammino et al., ibid. 72, 4090 (2001)] while keeping enough flexibility in terms of magnetic confinement and rf heating to determine best conditions for the production of intense beams of any charge state. First results were presented 1 year ago [Hitz et al., 8th European Particle Accelerator Conference, 2002; 15th International Workshop on ECR Ion Sources, 2002]. Since then, some improvements have been performed mostly in the magnetic confinement, beam extraction and analysis. Updated ion beam intensities are presented: e.g., 0.5 mA of Ar11+ at 18 GHz, 20 muA of Ar16+ and 1.8 muA of Ar17+ when GTS is operated at 14.5 GHz. On the other hand, charge coupled device imagers have been installed to diagnose and monitor the ion beam and some beam images are shown. (C) 2004 American Institute of Physics.
引用
收藏
页码:1403 / 1406
页数:4
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