The Influence of Geometry on Critical Current in Thin High-Tc Superconducting Tape

被引：5
|
作者：
Xue, Cun [1 ,2 ]
Zhou, Youhe [1 ,2 ]
机构：
[1] Lanzhou Univ, Key Lab Mech Disaster & Environm Western China, Minist Educ China, Lanzhou 730000, Peoples R China
[2] Lanzhou Univ, Dept Mech & Engn Sci, Lanzhou 730000, Peoples R China
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2014年 / 24卷 / 04期
关键词：
Critical current; field-dependent critical state model; magnetic field; superconducting film; CRITICAL-CURRENT DENSITY; THICKNESS DEPENDENCE; DEPOSITION; FILMS;
D O I：
10.1109/TASC.2014.2311378
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The influence of cross-sectional geometry on critical current in thin superconducting tape at self-field and external applied field is investigated based on the field-dependent critical state model. The critical current density profiles in the curved tape, V-shape tape, and U-shape tape exhibit quite different features from the flat tape. At self-field and external applied field, it is found that different cross-sectional geometries can lead to an enhancement or a reduction of critical current I-c, as compared with that for a flat tape, depending on the amplitude of applied field. The results of this paper are useful to optimize the cross section of superconducting tape for achieving high critical current.
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页数：6
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