Scanning near-field optical spectroscopy of quantum-confined semiconductor nanostructures

被引：0
|
作者：
Colocci, M [1 ]
Emiliani, V [1 ]
Gucciardi, PG [1 ]
Kudrna, J [1 ]
Vinattieri, A [1 ]
机构：
[1] Ist Nazl Fis Mat, Dipartimento Fis, I-50019 Sesto Fiorentino, Italy
来源：
NANOSCALE SPECTROSCOPY AND ITS APPLICATIONS TO SEMICONDUCTOR RESEARCH | 2002年 / 588卷
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Near-field optical microscopy allows to overcome the resolution limit due to diffraction by using sources and antennas having dimensions in the nanometer range. Recently this technique has been largely exploited to study the optical properties of low-dimensional semiconductor heterostructures. In this paper we describe the experimental implementation of Near-Field Spectroscopy as well as its applications to the investigation of group-III nitride quantum dots samples and III-V quantum wires structures.
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页码：199 / 209
页数：11
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