Test for the time independence of the fine structure constant, α, using cryogenic sapphire resonators at microwave frequencies

被引：0
|
作者：
Tobar, ME [1 ]
Hartnett, JG [1 ]
机构：
[1] Univ Western Australia, Dept Phys, Crawley, WA 6009, Australia
来源：
2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST | 2002年
关键词：
D O I：
10.1109/CPEM.2002.1034850
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new experiment to test for the time independence of the fine structure constant, a, is proposed. The experiment utilizes different polarized modes in a sapphire resonator. When configured as a dual mode sapphire clock, we show that it is possible to undertake a sensitive measurement from the beat frequency between the two modes.
引用
收藏
页码：320 / 320
页数：1
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