Threshold photoelectron spectroscopy in the inner-valence ionization region and photo-double ionization of SF6

被引:13
|
作者
Yencha, AJ [1 ]
Lopes, MCA
Thompson, DB
King, GC
机构
[1] SUNY Albany, Dept Chem, Albany, NY 12222 USA
[2] Univ Manchester, Schuster Lab, Dept Phys, Manchester M13 9PL, Lancs, England
[3] Univ Fed Juiz de Fora, ICE, Dept Fis, BR-36036330 Juiz de Fora, MG, Brazil
[4] Daresbury Lab, Warrington, Cheshire, England
关键词
D O I
10.1088/0953-4075/33/5/310
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The threshold photoelectron (TPE) spectrum of SF6 has been recorded over the photon energy range 25-140 eV using synchrotron radiation and a penetrating-field electron spectrometer. In addition, the photo-double ionization spectrum of SF6 has been obtained over the energy range 30.7-49.3 eV using the threshold photoelectrons coincidence technique. The TPE spectrum in the inner-valence ionization region is found to be significantly different to the conventional photoelectron spectrum in the same binding energy region. Indirect autoionization of neutral Rydberg and shape-resonance states of SFs dominate the formation of the TPE spectrum. Inner-valence SF6+ ion states appear to play a major role in the formation of the SF62+ ion states. The onset of double ionization in SF6 was found to occur at 31.98 +/- 0.02 eV.
引用
收藏
页码:945 / 954
页数:10
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