Long term stability estimation of DC electrical source from low frequency noise measurements

被引：5
|
作者：
Giusi, G [1 ]
Scandurra, G [1 ]
Ciofi, C [1 ]
Pace, C [1 ]
机构：
[1] Univ Messina, DFMTFA, I-98166 Messina, Italy
来源：
NOISE IN DEVICES AND CIRCUITS II | 2004年 / 5470卷
关键词：
noise measurements; stability; variance;
D O I：
10.1117/12.547137
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An indirect approach for estimating the long term stability of DC electrical sources from low frequency noise measurements is presented and discussed. In particular, it is demonstrated that once the unity frequency magnitude and the frequency exponent of the flicker noise component are determined, an overestimate of the variance of repeated measurements of the source output (averaged over a time interval tau) taken DeltaT seconds apart can be readily obtained. The proposed approach is validated with reference to actual experimental data.
引用
收藏
页码：470 / 479
页数：10
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