Volume phase elements in chalcogenide (Ge33As12Se55) thin films

被引：0
|
作者：
Joerg, Alexandre [1 ]
Lequime, Michel [1 ]
Lumeau, Julien [1 ]
机构：
[1] Aix Marseille Univ, Cent Marseille, CNRS, Inst Fresnel,UMR 7249, F-13013 Marseille, France
来源：
OPTICAL SYSTEMS DESIGN 2015: ADVANCES IN OPTICAL THIN FILMS V | 2015年 / 9627卷
关键词：
Volume phase elements; Chalcogenide layer; AMTIR-1; Photosensitivity; Diffractive Optical Element; Binary Optics; Thin film devices; BEAM; ALGORITHM;
D O I：
10.1117/12.2191372
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Recording of binary volumetric diffractive optical elements within a 13 mu m thick photosensitive chalcogenide layer using an innovative exposure set-up based on digital micro-mirrors devices is demonstrated. Different examples of beam transformations are shown such as the conversion of Gaussian beam into higher order modes or top-hat beam shapers
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页数：10
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