Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model

被引：0

作者：

Davidson, Scott ^{[1
]}

机构：

[1] Sun Microsyst Inc, Sunnyvale, CA USA

来源：

2008 IEEE AUTOTESTCON, VOLS 1 AND 2 | 2008年

关键词：

DFT; Test Economics; Return on Investment;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

How can we justify system level DFT? We must show that it has a positive return on investment. Existing test ROI models are manufacturing centric, do not account for the disaggregation of the product realization process, and are often focused on a specific DFT method. We propose a new, top-down, hierarchical ROI model, which starts with potential benefits and can handle entire systems more effectively than current models.

引用

页码：104 / 109

页数：6

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