Structure and properties of vacuum deposited cadmium telluride thin films

被引：0
|
作者：
Shreekanthan, K. N.
Bangera, Kasturi V.
Shivakumar, G. K. [1 ]
Mahesha, M. G.
机构：
[1] Natl Inst Technol, Dept Phys, Srinivasnagar 575025, Karnataka, India
[2] NSS Coll, Dept Phys, Manjeri 676122, Kerala, India
来源：
INDIAN JOURNAL OF PURE & APPLIED PHYSICS | 2006年 / 44卷 / 09期
关键词：
thin films; cadmium telluride thin films; cubic structure;
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Systematic and detailed study of the growth and properties of vacuum deposited cadmium telluride thin films was made. Both p- and n-type films were grown and these films were characterized for their structural, optical, and electrical properties. The crystallographic structure of the deposits was found to be dependent on the rate of deposition. Low deposition rates were observed to result in hexagonal deposits whereas high rates of deposition favoured cubic structure for the film. Electrical and optical properties were also found to be dependent on the deposition parameters.
引用
收藏
页码：705 / 708
页数：4
相关论文
共 50 条
12345