Reliability inference for field conditions from accelerated degradation testing

被引:176
|
作者
Liao, Haitao
Elsayed, A. Elsayed [1 ]
机构
[1] Rutgers State Univ, Dept Ind & Syst Engn, Piscataway, NJ 08854 USA
[2] Wichita State Univ, Dept Ind & Mfg Engn, Wichita, KS 67260 USA
关键词
reliability prediction; stochastic stress exposure; approximation; Brownian motion with drift; Ito calculus;
D O I
10.1002/nav.20163
中图分类号
C93 [管理学]; O22 [运筹学];
学科分类号
070105 ; 12 ; 1201 ; 1202 ; 120202 ;
摘要
Accelerated degradation testing (ADT) is usually conducted under deterministic stresses such as constant-stress, step-stress, and cyclic-stress. Based on ADT data, an ADT model is developed to predict reliability under normal (field) operating conditions. In engineering applications, the "standard" approach for reliability prediction assumes that the normal operating conditions are deterministic or simply uses the mean values of the stresses while ignoring their variability. Such an approach may lead to significant prediction errors. In this paper, we extend an ADT model obtained from constant-stress ADT experiments to predict field reliability by considering the stress variations. A case study is provided to demonstrate the proposed statistical inference procedure. The accuracy of the procedure is verified by simulation using various distributions of field stresses. (C) 2006 Wiley Periodicals, Inc.
引用
收藏
页码:576 / 587
页数:12
相关论文
共 50 条
  • [1] Statistical Inference of Reliability with Multivariate Accelerated Degradation Data
    Zhou Y.
    Wang H.
    Lü W.
    [J]. Wang, Haowei (wyg2010123@126.com), 1600, Shanghai Jiaotong University (25): : 237 - 245
  • [2] Application of reliability enhancement testing in accelerated degradation testing
    Wang, Cong
    Feng, Jinfu
    Li, Guoshuai
    [J]. International Journal of Earth Sciences and Engineering, 2014, 7 (06): : 2325 - 2329
  • [3] A Bayesian reliability evaluation method with integrated accelerated degradation testing and field information
    Wang, Lizhi
    Pan, Rong
    Li, Xiaoyang
    Jiang, Tongmin
    [J]. RELIABILITY ENGINEERING & SYSTEM SAFETY, 2013, 112 : 38 - 47
  • [4] Storage Reliability Evaluation of Electronic Equipment from Accelerated Degradation Testing
    Zhang, Xuecheng
    Ma, Jingrun
    Hu, Jingsheng
    Gong, Jingjing
    [J]. 2012 INTERNATIONAL CONFERENCE ON QUALITY, RELIABILITY, RISK, MAINTENANCE, AND SAFETY ENGINEERING (ICQR2MSE), 2012, : 859 - 862
  • [5] Recoverability effects on reliability assessment for accelerated degradation testing
    Wang, Chengjie
    Liu, Jian
    Yang, Qingyu
    Hu, Qingpei
    Yu, Dan
    [J]. IISE TRANSACTIONS, 2023, 55 (07) : 698 - 710
  • [6] New methods in accelerated reliability testing of electronic components for automotives under field conditions
    Berek, H
    Tiederle, V
    Fritzsch, T
    [J]. TWENTY SECOND IEEE/CPMT INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY SYMPOSIUM, IEMT-EUROPE 1998: ELECTRONICS MANUFACTURING AND DEVELOPMENT FOR AUTOMOTIVES, 1998, : 143 - 146
  • [7] Reliability modeling and a statistical inference method of accelerated degradation testing with multiple stresses and dependent competing failure processes
    Liu, Yao
    Wang, Yashun
    Fan, Zhengwei
    Bai, Guanghan
    Chen, Xun
    [J]. RELIABILITY ENGINEERING & SYSTEM SAFETY, 2021, 213
  • [8] Performance degradation and reliability analysis of a MEMS flow sensor with accelerated degradation testing
    Kang, Qiaoqiao
    Lin, Yuzhe
    Tao, Jifang
    [J]. MICROELECTRONICS RELIABILITY, 2024, 152
  • [9] A Research on Optoelectronic Coupler Storage Reliability by Accelerated Degradation Testing
    Pei, Chun
    Fu, Guicui
    Wan, Bo
    Zhao, Youhu
    [J]. ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM 2016 PROCEEDINGS, 2016,
  • [10] A General Accelerated Destructive Degradation Testing Model for Reliability Analysis
    Ding, Yu
    Yang, Qingyu
    King, Caleb B.
    Hong, Yili
    [J]. IEEE TRANSACTIONS ON RELIABILITY, 2019, 68 (04) : 1272 - 1282