Probing microwave capacitance of self-assembled quantum dots

Self-assembled quantum dots have remarkable optical, electronic, and spintronic properties that make them leading candidates for quantum information technologies. Their characterization requires rapid and local determination of both charge and spin degrees of freedom. We present a way to probe the capacitance of small ensembles of quantum dots at microwave frequencies. The technique employs a capacitance sensor based on a microwave microstrip resonator with sensitivity similar to 10(-19) F/root Hz, high enough to probe single electrons. The integration of this design in a scanning microscope will provide an important tool for investigating single charge and spin dynamics in self-assembled quantum dot systems.