Three-Dimensional Shape Measurement Beyond Diffraction Limit for Measurement of Dynamic Events

被引:8
|
作者
Arai, Yasuhiko [1 ]
机构
[1] Kansai Univ, 3-3-35 Yamate Cho, Suita, Osaka, Japan
来源
关键词
SPECKLE-PATTERN-INTERFEROMETRY; INPLANE DISPLACEMENT MEASUREMENT; RESOLUTION LIMIT; DEFORMATION MEASUREMENT; BREAKING; NANO;
D O I
10.1007/978-981-32-9632-9_1
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
Speckle interferometry is one of the important measurement methods of deformation on an object with rough surfaces. In this paper, a method which can be applied to a three-dimensional (3-D) shape measurement for dynamic events is proposed. In the method, the differential coefficient distribution of the shape of such an object is detected by giving a known lateral shift in the computer memory in order to analyze using one-shot speckle pattern. The 3-D shape can be reconstructed by integrating the differential coefficient distribution. The method is also applied to the 3-D shape measurement of superfine structure beyond the diffraction limit. Furthermore, the influence of magnitude of lateral shift on shape is discussed.
引用
收藏
页码:1 / 10
页数:10
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